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Proceedings Paper

Three dimensional measurement module of transverse odd-even combinational Dammann grating
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Paper Abstract

With the release of IphoneX, compact 3D optical measurement has become a popular technology. An important application of compact 3D optical measurement is to realize 3D imaging of targets. A compact three-dimensional optical measuring instrument can project a coded or structured light pattern onto an object to achieve the purpose of three-dimensional imaging. Apple's solution is to design diffractive optical elements using algorithms (such as the Gerchberg-Saxton algorithm) to produce a fan-out staggered dot matrix projection pattern in which some dot matrix produce a lateral offset from adjacent dot matrix. In this paper, a new method is proposed to generate the interlaced lattice projection pattern, i. e. the transverse odd-even combinational Dammann grating method. This method produces the above pattern by two Dammann gratings placed perpendicular to the optical axis, which is different from the scheme proposed by Apple. The advantage of this scheme is that the overal structure is simple and the design cost is reduced, so it is easy to mass-produce, and its lateral combinational structure is conducive to the miniaturization and integration of devices, so it is convenient to integrate in various interconnected devices. For example, mobile phones with 3D face recognition using this technology are not only easy to use, but also highly secure.

Paper Details

Date Published: 8 November 2018
PDF: 8 pages
Proc. SPIE 10818, Holography, Diffractive Optics, and Applications VIII, 108180H (8 November 2018); doi: 10.1117/12.2500756
Show Author Affiliations
Dong Zhao, Jinan Univ. (China)
Changhe Zhou, Jinan Univ. (China)
Wei Jia, Jinan Univ. (China)
Jin Wang, Jinan Univ. (China)
Changcheng Xiang, Jinan Univ. (China)


Published in SPIE Proceedings Vol. 10818:
Holography, Diffractive Optics, and Applications VIII
Yunlong Sheng; Chongxiu Yu; Changhe Zhou, Editor(s)

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