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Proceedings Paper

Profile measurement using a self-mixing laser diode
Author(s): Han Wang; Yuxi Ruan; Lingzhi Cao; Yanguang Yu; Jiangtao Xi; Qinghua Guo; Jun Tong; Jitao Zhang
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Paper Abstract

When a fraction of external optical feedback re-enters inside cavity of a laser diode (LD), the laser intensity and its wavelength will thus be altered. The LD in this case is often called as a self-mixing laser diode (SMLD). This paper presents an SMLD for profile measurement. The LD is modulated by the injection current in triangular waveform and a target to be measured is installed on a mechanic scanning device. The reflection light by the target contains its surface profile. The profile information is then carried in the laser intensity and can be pickup by a photodiode packaged in the rear of the LD. We call this modulated laser intensity as self-mixing interferometric (SMI) signal. In this paper, a new algorithm is developed to retrieve the profile from the SMI signal. Results show that the proposed design is able to achieve the measurement of profile with high resolution.

Paper Details

Date Published: 6 November 2018
PDF: 8 pages
Proc. SPIE 10812, Semiconductor Lasers and Applications VIII, 1081211 (6 November 2018); doi: 10.1117/12.2500739
Show Author Affiliations
Han Wang, Univ. of Wollongong (Australia)
Yuxi Ruan, Univ. of Wollongong (Australia)
Lingzhi Cao, Zhengzhou Univ. of Light Industry (China)
Yanguang Yu, Univ. of Wollongong (Australia)
Jiangtao Xi, Univ. of Wollongong (Australia)
Qinghua Guo, Univ. of Wollongong (Australia)
Jun Tong, Univ. of Wollongong (Australia)
Jitao Zhang, Zhengzhou Univ. of Light Industry (China)


Published in SPIE Proceedings Vol. 10812:
Semiconductor Lasers and Applications VIII
Ning Hua Zhu; Werner H. Hofmann, Editor(s)

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