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Proceedings Paper

Spatial color-encoded phase-shifting technique for phase measuring deflectometry
Author(s): Suodong Ma; Guojun Lu; Fang Dai; Chunmei Zeng; Hua Shen
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Paper Abstract

Free-form optics has been attracted huge interest since it can significantly improve the performance of an optical system with a simpler structure. However, optical testing for free-form surfaces is usually more difficult compared with traditional ones. Although a variety of interferometers can achieve measurements with nanometer-scale precision, it suffers from the problems of a complex system configuration, a limited measurement range and relatively high requirements of testing conditions, etc. In contrast, phase measuring deflectometry (PMD) which has the benefits of a simple system structure, a large dynamic range and a high measurement accuracy is gradually becoming a powerful tool for free-form surface testing. Nevertheless, multiple groups of fringe patterns are required to sequentially display in two orthogonal directions to obtain the corresponding surface gradients in the classical PMD measurement. Therefore, a speedy detection of free-form surfaces is generally blocked. To overcome the above shortcoming, a spatial color-encoded phase-shifting strategy is put forward for PMD to acquire absolute phases with only four color images in this paper. Experimental results demonstrate the effectiveness of the proposed method as well.

Paper Details

Date Published: 24 July 2018
PDF: 7 pages
Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 1082721 (24 July 2018); doi: 10.1117/12.2500564
Show Author Affiliations
Suodong Ma, Soochow Univ. (China)
Guojun Lu, North Information Control Research Academy Group Co., Ltd. (China)
Fang Dai, East China Institute of Photo-electron IC (China)
Chunmei Zeng, Soochow Univ. (China)
Hua Shen, Nanjing Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 10827:
Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
Yingjie Yu; Chao Zuo; Kemao Qian, Editor(s)

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