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Extraction of properties of individual component for the retarder-linear diattenuator-retarder system and its application
Author(s): Lianhua Jin; Eiichi Kondoh; Hiroyuki Kowa; Bernard Gelloz
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Paper Abstract

A method for extracting properties of individual components of a retader-linear diattenuator- retarder system is proposed. Since the evaluation performs in noncontact and nondestructive way, this method is applicable to inspect as-produced devices and optics. Example for its application to inspection of the polarizing beamsplitter is presented.

Paper Details

Date Published: 2 November 2018
PDF: 7 pages
Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108190R (2 November 2018); doi: 10.1117/12.2500465
Show Author Affiliations
Lianhua Jin, Univ. of Yamanashi (Japan)
Eiichi Kondoh, Univ. of Yamanashi (Japan)
Hiroyuki Kowa, Uniopt Co. Ltd. (Japan)
Bernard Gelloz, Nagoya Univ. (Japan)


Published in SPIE Proceedings Vol. 10819:
Optical Metrology and Inspection for Industrial Applications V
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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