Share Email Print
cover

Proceedings Paper • new

Modified Fourier transform profilometry based on digital time-multiplexing technique
Author(s): Canlin Zhou; XiaoLei Li; Shuchun Si; Zhenkun Lei; YanJie Li
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In order to avoid frequency aliasing,improve the spatial resolution of the phase map in Fourier transform Profilometry(FTP),an approach based on the digital time-multiplexing technique is proposed to remove the background component from the deformed fringe pattern. Firstly, a sinusoidal fringe pattern is projected onto the tested object by digital-light-processing( DLP) projector, the fringe pattern modulated by the object’s surface is captured by a CCD camera.Secondly, apply Fourier transform to the captured fringe pattern to obtain the spectrum. Thirdly, rotate the specimen’s fringe pattern 90-deg to obtain the rotated fringe pattern , then obtain the new spectrum corresponding to the rotated fringe pattern.Fourthly,the new spectrum is subtracted from the original spectrum ,clip the negative going values in the resultant spectrum by digital manipulation.Fifthly, filter out the first-order spectrum from the resultant spectrum by the band filter,apply inverse Fourier transform to the selected spectrum to obtain complex fields,then retrieve the phase, unwrap the wrapped phase map by the phase unwrapping algorithm.Finally, the simulation and experimental evaluations are conducted to prove the validity and performance of the proposed method. The results are analyzed and compared with those of the conventional method.The effectiveness and superiority of the proposed method have been demonstrated and verified.

Paper Details

Date Published: 24 July 2018
PDF: 8 pages
Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 108271S (24 July 2018); doi: 10.1117/12.2500390
Show Author Affiliations
Canlin Zhou, Shandong Univ. (China)
XiaoLei Li, Hebei Univ. of Technology (China)
Shuchun Si, Shandong Univ. (China)
Zhenkun Lei, Dalian Univ. of Technology (China)
YanJie Li, Jinan Univ. (China)


Published in SPIE Proceedings Vol. 10827:
Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
Yingjie Yu; Chao Zuo; Kemao Qian, Editor(s)

© SPIE. Terms of Use
Back to Top