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Proceedings Paper

U.S. National Committee proposed revision to the ISO Laser Damage Standard: 2018 Progress Report (Conference Presentation)
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Paper Abstract

In previous years, this committee reported on the need for a US National Laser damage standard, addressing the needs of domestic industry. [1] Last year, a process was reported that connected the measurement of the active defect density in a small area, a, with the likely density of such defects over a larger area, A. This was presented as the basis of a Type 1, go/no-go test. The main issue as reported last year is that the proper flow of a standard is to start with the required properties of the larger area and design a robust test. The process presented in 2017 [2] is hard to implement in a way convenient for the non-expert user, which is nearly all. The main thrust of the work in 2018, is developing and evaluating options for implementing a useful workable standard. [1] “Periodic Review of ISO 21254: US National Committee Proposal for Revision”, Jonathan W. Arenberg, Donna J. Howland, Christopher Wren Carr, Michael D. Thomas, John C. Bellum, Trey Robinson and Jason Yager, Presented at SPIE Laser Damage, Boulder CO, 2016 [2] "U.S. National Committee proposed revision to the ISO Laser Damage Standard”, Jonathan W. Arenberg, Donna Howland, Michael Thomas, Trey Turner, John Bellum, Ella Field, C. Wren Carr, Gary Shaffer, Matthew Brophy, Allen Krisiloff, Proc. SPIE 10447, Laser-Induced Damage in Optical Materials 2017, 104471E (21 November 2017)

Paper Details

Date Published: 26 November 2018
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Proc. SPIE 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference, 108050B (26 November 2018); doi: 10.1117/12.2500369
Show Author Affiliations
Jonathan W. Arenberg, Northrop Grumman Aerospace Systems (United States)
Donna Howland, Northrop Grumman Aerospace Systems (United States)
Michael D. Thomas, Spica Technologies, Inc. (United States)
Trey Turner, Research Electro-Optics, Inc. (United States)
Allen Krisiloff, Triptar Lens Co., Inc. (United States)


Published in SPIE Proceedings Vol. 10805:
Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference
Christopher Wren Carr; Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M.J. Soileau, Editor(s)

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