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Extensive time-resolved investigation of laser-induced damage fatigue of single layer dielectric coating
Author(s): Linas Smalakys; Balys Momgaudis; Mikas Vengris; Robertas Grigutis; Andrius Melninkaitis
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Paper Abstract

The decrease of laser-induced damage threshold (LIDT) when exposed with high number of laser pulses is a well-known phenomenon in dielectrics. In the femtosecond regime this fatigue is usually attributed to the accumulation of laser-induced lattice defects. Little is known about the accumulation mechanisms in oxides used for dielectric coatings. In this work, S-on-1 laser-induced damage threshold test was combined with time-resolved digital holography in order to investigate laser-induced lattice defects in Nb2O5 single layer. The results provided insights into the current understanding of accumulation of laser-induced defects.

Paper Details

Date Published: 16 November 2018
PDF: 7 pages
Proc. SPIE 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference, 108050Z (16 November 2018); doi: 10.1117/12.2500337
Show Author Affiliations
Linas Smalakys, Vilnius Univ. (Lithuania)
Balys Momgaudis, Vilnius Univ. (Lithuania)
Mikas Vengris, Vilnius Univ. (Lithuania)
Robertas Grigutis, Vilnius Univ. (Lithuania)
Andrius Melninkaitis, Vilnius Univ. (Lithuania)


Published in SPIE Proceedings Vol. 10805:
Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference
Christopher Wren Carr; Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M.J. Soileau, Editor(s)

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