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Proceedings Paper

An improved method based on a new wavelet transform for overlapped peak detection on Raman spectra
Author(s): Minghui Liu; Zuoren Dong; Guofeng Xin; Yanguang Sun; Ronghui Qu
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Paper Abstract

Peak detection is an important step in the chemical identification by Raman spectroscopy. At present, most peak detection methods have finite identification ability on overlapping peaks, especially for the spectrum measured by the portable spectrometer with low resolution. In this paper, an improved method is proposed that using continuous wavelet transform(CWT) peak detection method based on a new wavelet on the deconvolved Raman spectrum. The new wavelet has smaller linewidth and is more similar with the intrinsic line profile of Raman spectroscopy, Lorentz line profile. So it has advantages on overlapping peaks detection. The proposed method was evaluated by Raman spectrum of solid amino acid mixtures. The results show that it is better at detecting overlapping peaks than the other two wavelets.

Paper Details

Date Published: 9 November 2018
PDF: 8 pages
Proc. SPIE 10826, Infrared, Millimeter-Wave, and Terahertz Technologies V, 108260R (9 November 2018); doi: 10.1117/12.2500272
Show Author Affiliations
Minghui Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Zuoren Dong, Shanghai Institute of Optics and Fine Mechanics (China)
Guofeng Xin, Shanghai Institute of Optics and Fine Mechanics (China)
Yanguang Sun, Shanghai Institute of Optics and Fine Mechanics (China)
Ronghui Qu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10826:
Infrared, Millimeter-Wave, and Terahertz Technologies V
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

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