Share Email Print
cover

Proceedings Paper

A comparison of LIDT behavior of AR-coated yttrium-aluminium-garnet substrates with respect to thin-film design and coating technology
Author(s): Štěpán Uxa; Václav Škoda; Jan Vanda; Mihai-George Muresan
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Several sets of polished substrates were manufactured from monocrystalline yttrium-aluminium-garnet (YAG) grown by the Czochralski method. Samples were coated by both narrow-band and broad-band dielectric anti-reflection (AR) thin-film system prepared using either reactive or ion-assisted e-beam deposition technology and tested for laser-induced damage threshold (LIDT) at 1030 nm 10 ns in s-on-1 mode according to the ISO 21254 standard. Measured damage thresholds at normal (0 deg) incidence were compared for different thin-film designs and coating technology.

Paper Details

Date Published: 16 November 2018
PDF: 7 pages
Proc. SPIE 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference, 108051R (16 November 2018); doi: 10.1117/12.2500189
Show Author Affiliations
Štěpán Uxa, CRYTUR spol s.r.o. (Czech Republic)
Václav Škoda, CRYTUR spol s.r.o. (Czech Republic)
Jan Vanda, HiLASE Ctr., Institute of Physics of the ASCR, v.v.i. (Czech Republic)
Mihai-George Muresan, HiLASE Ctr., Institute of Physics of the ASCR, v.v.i. (Czech Republic)


Published in SPIE Proceedings Vol. 10805:
Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference
Christopher Wren Carr; Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M.J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top