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Proceedings Paper

Measurement of stress birefringence in optical disk substrates
Author(s): Xishan Li; Wendong Xu; Li Zhu
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Paper Abstract

The theory and experimental analysis has been made in this paper for the change of phase retardation in optical disk substrates when light beams pass through them from different incident angles. We tested the PC and glass substrate by using a polarization phase modulation method with Polarizer- Modulation-Compensator-Specimen-Analyzer structure.

Paper Details

Date Published: 3 September 1996
PDF: 6 pages
Proc. SPIE 2931, Fourth International Symposium on Optical Storage (ISOS '96), (3 September 1996); doi: 10.1117/12.248714
Show Author Affiliations
Xishan Li, Shanghai Institute of Optics and Fine Mechanics (China)
Wendong Xu, Shanghai Institute of Optics and Fine Mechanics (China)
Li Zhu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 2931:
Fourth International Symposium on Optical Storage (ISOS '96)
Fuxi Gan, Editor(s)

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