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Proceedings Paper

Holographic modal analysis for the separation of narrow-spaced eigenmodes
Author(s): Hermann Klingele; Hans Steinbichler; Raymond Freymann; Wolfram Honsberg; Carsten Haberstok
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Paper Abstract

The automotive industry has particular interest in obtaining modal models of panel-like structures in the higher frequency range where the accuracy of FE-models normally is not longer sufficient to predict the dynamic response of a car body structure to a given operational excitation. Experimental modal analysis can fill this gap. However, the sensors which are currently used for the acquisition of vibrational data (accelerometers, laser vibrometer) are limited in spatial resolution and therefore higher-order panel modes are hard to be investigated. Holographic interferometry is widely used for qualitative and quantitative measurements of the mode shapes of dynamic systems, where its high spatial resolution outperforms any other kind of vibrational dynamic sensor. The limitations of holography with respect to the sampling rate can be overcome in the context of modal analysis by using stepped sine testing. A large number of holograms is then automatically recorded and evaluated. First results on a test structure which exhibits narrow-spaced eigenmodes are shown using this kind of measurement setup with a high frequency resolution. The dense vibration data enables the modal analysis software to separate the eigenmodes.

Paper Details

Date Published: 23 August 1996
PDF: 6 pages
Proc. SPIE 2868, Second International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (23 August 1996); doi: 10.1117/12.248664
Show Author Affiliations
Hermann Klingele, Steinbichler Optotechnik GmbH (Germany)
Hans Steinbichler, Steinbichler Optotechnik GmbH (Germany)
Raymond Freymann, BMW AG (Germany)
Wolfram Honsberg, BMW AG (Germany)
Carsten Haberstok, BMW AG (Germany)


Published in SPIE Proceedings Vol. 2868:
Second International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
Enrico Primo Tomasini, Editor(s)

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