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Proceedings Paper

Application of combined method of electronic speckle pattern interferometry and holography to vibration analysis
Author(s): Bernhard Lau; Peter Kuschnir; Uwe Schmid; Valery Petrov
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Paper Abstract

Electronic speckle pattern interferometry (ESPI) and holographic interferometry are powerful tools for vibration analysis. They allow to measure the spatial distribution of a vibration amplitude in the micrometer or submicrometer range for the purpose of modal analysis for nondestructive testing. As for ESPI, this method principally is very suited for large-scale industrial optical inspections because the interferograms are recorded with a video camera and evaluated in quasi real time with a computer and no media costs for the measurements arise. However current speckle pattern interferometers have rather complicated and expensive optical setups whose elements are aligned with difficulty. On the other hand, holographic interferometry which can provide interferograms with less noise and higher resolution requires an optical setup of at least similar complexity, and in addition a holographic recording medium such as silver halide material or photothermoplastic film. The negative influence of all these drawbacks are drastically reduced in a method which combines positive features of ESPI and holography. This method has already proved its validity for different objects loaded in statics. It can be successfully applied to vibrating objects.

Paper Details

Date Published: 23 August 1996
PDF: 6 pages
Proc. SPIE 2868, Second International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (23 August 1996); doi: 10.1117/12.248657
Show Author Affiliations
Bernhard Lau, Fachhochschule Ulm (Germany)
Peter Kuschnir, Fachhochschule Ulm (Germany)
Uwe Schmid, Fachhochschule Ulm (Germany)
Valery Petrov, Independent Researcher (Germany)


Published in SPIE Proceedings Vol. 2868:
Second International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
Enrico Primo Tomasini, Editor(s)

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