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Proceedings Paper

New image processing technique for transient fringe evaluation
Author(s): Henning Rehn; Richard M. Kowarschik
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Paper Abstract

Our technique allows for the evaluation of a cross-section of a fringe pattern with a temporal resolution of 40 ms over a range of 20s. It can be applied to all two-beam interferometer, fringe projection, or ESPI techniques if a phase shift device is a part of the optical set-up.

Paper Details

Date Published: 26 August 1996
PDF: 5 pages
Proc. SPIE 2785, Vision Systems: New Image Processing Techniques, (26 August 1996); doi: 10.1117/12.248551
Show Author Affiliations
Henning Rehn, Friedrich-Schiller-Univ. Jena (Germany)
Richard M. Kowarschik, Friedrich-Schiller-Univ. Jena (Germany)

Published in SPIE Proceedings Vol. 2785:
Vision Systems: New Image Processing Techniques
Philippe Refregier, Editor(s)

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