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Proceedings Paper

Degradation of graphite/bismaleimide laminates with multiple embedded fiber optic sensors
Author(s): David W. Jensen; Jesus Pascual
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Paper Abstract

This paper summarizes the reduction in mechanical properties of graphite/bismaleimide (Gr/BMI) laminates due to the presence of multiple embedded fiber-optic sensors. Previous work has shown that small quantities of optical fibers embedded parallel to the loading direction have only a negligible effect on the tension behavior of laminated structures. This work establishes the significance of larger quantities of embedded optical fibers on the tensile and compressive behavior of composite laminates. Experimental strength and modulus data from six test groups of seven tension and seven compression specimens are compared to a control group. All specimens were fabricated from G40-600/5245C Gr/BMI pre-preg tape to form a [°3/9o2/°]s stacking sequence. The quantity of optical fibers embedded parallel to the loading direction was varied in the different test groups. Uniaxial compression testing using an IITRI fixture and uniaxial tension testing were performed in accordance with ASTM Standards. Catastrophic failure was induced by fiber fracture. Results indicate that large quantities of embedded optical fibers reduce the static tensile strength up to 4% and stiffness up to 9%, while reducing the static compressive strength up to 24% and stiffness up to 20%. It is concluded that large quantities of embedded optical fibers result in significant degradation of the compressive strength of laminated composite structures, but do not significantly affect the tensile behavior.

Paper Details

Date Published: 1 December 1990
PDF: 10 pages
Proc. SPIE 1370, Fiber Optic Smart Structures and Skins III, (1 December 1990); doi: 10.1117/12.24838
Show Author Affiliations
David W. Jensen, The Pennsylvania State Univ. (United States)
Jesus Pascual, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 1370:
Fiber Optic Smart Structures and Skins III
Richard O. Claus; Eric Udd, Editor(s)

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