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Proceedings Paper

High-speed digital ellipsometer for the study of fiber optic sensor systems
Author(s): Indu F. Saxena
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Paper Abstract

The paper describes a high-speed digital ellipsometer, called 'discrete retardation modulation ellipsometer', designed for investigating fiber-optic sensor systems. The new device uses an electrooptic modulator to extract all four Stokes parameters and, thus, does not require lock-in amplifiers. The ellipsometer was used to measure the response of an optical fiber current sensor to test current at 4 kHz. The result was found to be within 10 percent from the expected value.

Paper Details

Date Published: 1 February 1991
PDF: 7 pages
Proc. SPIE 1367, Fiber Optic and Laser Sensors VIII, (1 February 1991); doi: 10.1117/12.24766
Show Author Affiliations
Indu F. Saxena, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 1367:
Fiber Optic and Laser Sensors VIII
Ramon P. DePaula; Eric Udd, Editor(s)

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