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Proceedings Paper

Absolute interferometer for manufacturing applications
Author(s): Michael R. Tucker; Eric R. Christenson
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Paper Abstract

A multiwave interferometer was developed for accurate measurements of absolute distance over distances on the order of inches. The principle of the device is based on using multiwave interferometry to create artificial wavelengths between 1 micron and 50 mm. Phase measurements for pairs of optical wavelengths are used to mathematically produce a phase measurement equal to that of a much longer 'equivalent' wavelength; if the pair of wavelengths are close together, a long equivalent wavelength is produced. Each optical wavelength is assigned to a distinct heterodyne frequency and is multiplexed onto the same measurement beam.

Paper Details

Date Published: 1 February 1991
PDF: 11 pages
Proc. SPIE 1367, Fiber Optic and Laser Sensors VIII, (1 February 1991); doi: 10.1117/12.24757
Show Author Affiliations
Michael R. Tucker, FASTMAN, Inc. (United States)
Eric R. Christenson, FASTMAN, Inc. (United States)


Published in SPIE Proceedings Vol. 1367:
Fiber Optic and Laser Sensors VIII
Ramon P. DePaula; Eric Udd, Editor(s)

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