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Proceedings Paper

Measurement of mode field diameter and fiber bending loss
Author(s): Ying John Kiang; Daniel J. Stigliani
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Paper Details

Date Published: 1 February 1991
PDF: 7 pages
Proc. SPIE 1366, Fiber Optics Reliability: Benign and Adverse Environments IV, (1 February 1991); doi: 10.1117/12.24704
Show Author Affiliations
Ying John Kiang, IBM Data System Div. (United States)
Daniel J. Stigliani, IBM Data System Div. (United States)


Published in SPIE Proceedings Vol. 1366:
Fiber Optics Reliability: Benign and Adverse Environments IV
Roger A. Greenwell; Dilip K. Paul, Editor(s)

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