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Proceedings Paper

Analysis of defects in multilayers through photothermal deflection technique
Author(s): Mario Bertolotti; Roberto Li Voti; Concita Sibilia; G. L. Liakhou
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Paper Abstract

A theoretical discussion on the resolution of buried air defects by using the photothermal deflection technique is presented. The thermal wave interferometry theory is described for the general case of layered materials. The principle of measurement of thermal parameter is reviewed. The analysis of buried air gap is made considering the defect like a mirror which is able to reflect partially the thermal wave giving rise to an interference effect at the solid surface. The condition of this interference is studied together with the limit to the capability to detect defects. The surprising theoretical result is that an air buried layer of thickness less than 1 percent of the air thermal wavelength is still detectable. The photothermal deflection technique is introduced as a suitable technique to investigate the thermal interference effects.

Paper Details

Date Published: 19 August 1996
PDF: 10 pages
Proc. SPIE 2775, Specification, Production, and Testing of Optical Components and Systems, (19 August 1996); doi: 10.1117/12.246763
Show Author Affiliations
Mario Bertolotti, Univ. degli Studi di Roma La Sapienza (Italy)
Roberto Li Voti, Univ. degli Studi di Roma La Sapienza (Italy)
Concita Sibilia, Univ. degli Studi di Roma La Sapienza (Italy)
G. L. Liakhou, Technical Univ. of Moldova (Moldova)


Published in SPIE Proceedings Vol. 2775:
Specification, Production, and Testing of Optical Components and Systems
Anthony E. Gee; Jean-Francois Houee, Editor(s)

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