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Proceedings Paper

Characterization of surface roughness by heterodyne interferometry: theory and experiment
Author(s): Patrick Chaton; Francoise Baume; Laurent Jouanet; Jean-Yves Robic
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Paper Abstract

Heterodyne interferometry is a powerful technique for measuring very small phase variations of modulated signals which has been widely used for measuring the roughness of optical surfaces. This paper will begin with a general recall of the principles of this technique. We then propose a method based on the use of the statistical moments of the height distribution of roughness. In order to quantify the stationary of the surface roughness, methodology based on the study surface roughness of BK7, heavy glass and silicon dioxide.

Paper Details

Date Published: 19 August 1996
PDF: 12 pages
Proc. SPIE 2775, Specification, Production, and Testing of Optical Components and Systems, (19 August 1996); doi: 10.1117/12.246759
Show Author Affiliations
Patrick Chaton, LETI-DOPT-CMO (France)
Francoise Baume, LETI-DOPT-CMO (France)
Laurent Jouanet, LETI-DOPT-CMO (France)
Jean-Yves Robic, LETI-DOPT-CMO (France)


Published in SPIE Proceedings Vol. 2775:
Specification, Production, and Testing of Optical Components and Systems
Anthony E. Gee; Jean-Francois Houee, Editor(s)

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