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Proceedings Paper

Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths
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Paper Abstract

A total integrated scattering measurement set-up is described which enables the detection of scattered light within a spatial frequency range from 0.0041 micrometers-1 to 4 micrometers-1. The apparatus is based on a Coblentz sphere and is equipped with light sources in the wavelength range from the UV to IR. Examples are presented of measurements on samples with rms- roughnesses from angstroms to microns.

Paper Details

Date Published: 19 August 1996
PDF: 8 pages
Proc. SPIE 2775, Specification, Production, and Testing of Optical Components and Systems, (19 August 1996); doi: 10.1117/12.246758
Show Author Affiliations
Stefan Gliech, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Angela Duparre, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)


Published in SPIE Proceedings Vol. 2775:
Specification, Production, and Testing of Optical Components and Systems
Anthony E. Gee; Jean-Francois Houee, Editor(s)

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