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Proceedings Paper

Statistical tolerancing for optics
Author(s): David P. Forse
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Paper Abstract

Choosing tolerances for parameters that affect optical performance presents difficulty. Cost of the finished product is proposed as the only selection criterion and evaluation of cost requires an estimate of yield. A methodology is outlined for interpreting tolerances statistically for use in a monte carlo ray tracing program in order to estimate performance variability and hence yield. The method has been used to achieve high production yield but the loop through cost has not yet been completed. Feedback from production has been used with the aim of refining both the tolerance modeling techniques and the production processes.

Paper Details

Date Published: 19 August 1996
PDF: 10 pages
Proc. SPIE 2775, Specification, Production, and Testing of Optical Components and Systems, (19 August 1996); doi: 10.1117/12.246746
Show Author Affiliations
David P. Forse, Pilkington Thorn Optronics (United Kingdom)


Published in SPIE Proceedings Vol. 2775:
Specification, Production, and Testing of Optical Components and Systems
Anthony E. Gee; Jean-Francois Houee, Editor(s)

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