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Proceedings Paper

Engineering of Z-Scan experimental configuration for fast characterization of nonlinear materials
Author(s): Eugenio Fazio; Paolo Bevilacqua; Mario Bertolotti
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Paper Abstract

An engineering of the Z-scan technique is proposed for a direct measurement of the nonlinear variation of the refractive index of optical materials. The proposed set-up is fast and it gives a real-time control of the experiment. The configuration is based on a fast oscillation of the sample across the focal point of a lens by which the whole experimental signal can be visualized at once on an oscilloscope. Direct digitalization of the oscillograms could increase the experimental sensitivity and gives an on- line control of the noise. In this way both optical and electrical noises can be identified and reduced by suitable filtering.

Paper Details

Date Published: 19 August 1996
PDF: 5 pages
Proc. SPIE 2775, Specification, Production, and Testing of Optical Components and Systems, (19 August 1996); doi: 10.1117/12.246742
Show Author Affiliations
Eugenio Fazio, Univ. degli Studi di Roma La Sapienza (Italy)
Paolo Bevilacqua, Univ. degli Studi di Roma La Sapienza (Italy)
Mario Bertolotti, Univ. degli Studi di Roma La Sapienza (Italy)


Published in SPIE Proceedings Vol. 2775:
Specification, Production, and Testing of Optical Components and Systems
Anthony E. Gee; Jean-Francois Houee, Editor(s)

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