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Proceedings Paper

Method of measure the thickness of liquid crystal layer using phase plate
Author(s): Masami Ito; Atsushi Fukui; Kanji Nishii; Kenji Takamoto
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Paper Abstract

The measurement of thickness of the liquid crystal layer has been done using the optical interference method with spectrophotometer up to now. But it took more than one minute to measure the thickness, and in-line measurement was impossible. So, in this paper, the measuring method of the thickness of the liquid crystal layer that it is possible to measure the thickness at high speed for about one second is proposed, and it is reported about the principle. And we report the comparison experimental results with this method and conventional method.

Paper Details

Date Published: 16 August 1996
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246256
Show Author Affiliations
Masami Ito, Matsushita Electric Industrial Co., Ltd. (Japan)
Atsushi Fukui, Matsushita Electric Industrial Co., Ltd. (Japan)
Kanji Nishii, Matsushita Electric Industrial Co., Ltd. (Japan)
Kenji Takamoto, Matushita Electric Industrial Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology

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