Share Email Print
cover

Proceedings Paper

Simultaneous measurement of linear and circular birefringence with heterodyne interferometry
Author(s): Hiroyuki Kowa; Kanae Muraki; Mitsuo Tsukiji; Atsuo Takayanagi; Norihiro Umeda
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a novel technique to measure both linear and circular birefringence, simultaneously. This technique is based on an optical heterodyne interferometry which is performed by an orthogonally polarized two frequency laser. Two orthogonal components of the optical beat signal are detected by two-phase lock-in amplifier. The two components change sinusoidally with the rotation of azimuth angle of polarization devices. The retardation and the orientation of linear birefringence and the rotation angle of circular birefringence can be calculated by applying a Fourier analysis to the two sinusoidal variations. The measurement sensitivity for this method is verified by using the combination of a Babinet Soleil compensator and a half-wave plate as a sample. It is demonstrated that the birefringence of commercially available twisted nematic liquid crystal cell where a driving voltage is applied can be measured by using the proposed technique.

Paper Details

Date Published: 16 August 1996
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246241
Show Author Affiliations
Hiroyuki Kowa, Uniopt Co., Ltd. (Japan)
Kanae Muraki, Uniopt Co., Ltd. (Japan)
Mitsuo Tsukiji, Uniopt Co., Ltd. (Japan)
Atsuo Takayanagi, Tokyo Univ. of Agriculture and Technology (Japan)
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)

© SPIE. Terms of Use
Back to Top