Share Email Print

Proceedings Paper

Dual-beam light-scattering tomography (LST) for detection of functional defects in nonlinear optical crystals
Author(s): Tomoya Ogawa; Satoru Kawaai; Qiguang Tan; Nobuhito Nango
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical nonlinearity is a very important and useful phenomenon for frequency up-conversion of laser beams and for heterodyne demodulation due to mixing of optical signals, which will be realized by high quality crystals with large conversion efficiency. Since one of the candidates is BBO (beta-BaB2O4) crystals, the light scattering from the crystals was detected by two vidicon systems under an IR laser beam scanning. Here, one of the systems is used for detection of the scattered IR rays due to defects and the other for the visible light, both of which will simultaneously acquire the scattered light intensities from the crystal.

Paper Details

Date Published: 16 August 1996
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246225
Show Author Affiliations
Tomoya Ogawa, Gakushuin Univ. (Japan)
Satoru Kawaai, Gakushuin Univ. (Japan)
Qiguang Tan, Fujian Institute of Research on the Structure of Matter (China)
Nobuhito Nango, Ratoc System Engineering Co. Ltd. (Japan)

Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)

© SPIE. Terms of Use
Back to Top