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Proceedings Paper

Retardation-modulated differential interference microscope and its application to 3D shape measurement
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Paper Abstract

The retardation modulated DIC is proposed for extracting phase information from a DIC image by analyzing the partial coherent theory, which is applied to DIC image enhancement and phase information extraction.

Paper Details

Date Published: 16 August 1996
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246219
Show Author Affiliations
Hiroshi Ishiwata, Olympus Optical Co. (Japan)
Masahide Itoh, Tsukuba Univ. and Ctr. for Tsukuba Advanced Research Alliance (Japan)
Toyohiko Yatagai, Tsukuba Univ. and Ctr. for Tsukuba Advanced Research Alliance (Japan)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)

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