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Proceedings Paper

Measurement of low-level strain birefringence in optical elements using a photoelastic modulator
Author(s): Theodore C. Oakberg
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Paper Abstract

Measurements of low levels of strain birefringence in fused silica glass have been made using a system based on a photoelastic modulator. Measurements of sample net retardation have been made with a resolution of 0.1 nanometers. Measured values of a strain birefringence constant for fused silica are in good agreement with established data.

Paper Details

Date Published: 16 August 1996
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246208
Show Author Affiliations
Theodore C. Oakberg, Hinds Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)

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