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Proceedings Paper

Fast ellipsometry and Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter
Author(s): Shankar Krishnan; Paul C. Nordine
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Paper Abstract

This paper describes the division-of-amplitude photopolarimeter, DOAP, which measures the complete polarization state of light at rates up to 2 KHz and is being developed for measurement rates up to 2 MHz. Application of the DOAP for fast ellipsometry and for Mueller-matrix ellipsometry is also described. Example results from fast ellipsometry during pulse heating experiments are given. Mueller-matrix ellipsometry using rotating quarter wave retarders and liquid crystal phase retarders is presented along with recent results.

Paper Details

Date Published: 16 August 1996
PDF: 5 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246205
Show Author Affiliations
Shankar Krishnan, Containerless Research, Inc. (United States)
Paul C. Nordine, Containerless Research, Inc. (United States)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology

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