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Proceedings Paper

Fast birefringence measurement using right and left hand circulary polarized laser
Author(s): Norihiro Umeda; Sho Wakayama; Shinsuki Arakawa; Atsuo Takayanagi; Hiroyuki Kohwa
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Paper Abstract

A fast and accurate birefringence measurement system has been built to study the in-plane birefringence of a rotating optical disk substrate. The fully automated instrument incorporates an axial Zeeman laser which emits both right and left hand circularly polarized lights, stationary polarization elements and a lock-in amplifier. Measurement results showing the accurate and fast features on the system are presented. It is also demonstrated that the in-plane birefringence mapping in rotating substrate of optical disk can be obtained by use of the ability of fast birefringence measurement.

Paper Details

Date Published: 16 August 1996
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246195
Show Author Affiliations
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)
Sho Wakayama, Tokyo Univ. of Agriculture and Technology (Japan)
Shinsuki Arakawa, Tokyo Univ. of Agriculture and Technology (Japan)
Atsuo Takayanagi, Tokyo Univ. of Agriculture & Technology (Japan)
Hiroyuki Kohwa, Uniopt Co. Ltd. (Japan)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)

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