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Proceedings Paper

Mueller matrix imaging polarimetry: an overview
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Paper Abstract

The design and operation of a Mueller matrix imaging polarimeter (MMIP) are presented. The instrument is configurable to operate in transmission, reflection, retroreflection, and variable-angle scattering to make a wide variety of polarimetric measurements. The sample may be a single element such as a lens, polarizer, retarder, spatial light modulator, or beamsplitter; the tested sample may also be an entire polarization-critical optical system containing many elements. The MMIP instrument combines a dual-rotating retarder polarimeter with high-resolution imaging capacity. Well-calibrated known polarized light states are incident upon the sample and the exiting state is precisely analyzed. By measuring a series of different generated and analyzed state, the Mueller matrix can be determined. `Decomposing' the measured Mueller matrix into retardance, diattenuation, and depolarization components can give a complete description of the sample's effect on an arbitrary light state. In one system configuration, the MMIP measures the polarization of a set of ray paths through a sample. Another configuration measures the sample's point spread matrix, a Mueller matrix relating the polarization state of a point object to the distribution of intensity and polarization across the image. The MMIP instrument and measurement capabilities are described along with an assortment of previous results.

Paper Details

Date Published: 16 August 1996
PDF: 8 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246186
Show Author Affiliations
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)
Elizabeth A. Sornsin, Univ. of Alabama in Huntsville (United States)
J. Larry Pezzaniti, Abbott Labs. (United States)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)

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