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Proceedings Paper

Measurement of molecular orientation of polymer films during rapid elongation process by means of birefringence using phase modulation technology
Author(s): Kentaro Egoshi; Yoshihiro Mochida
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Paper Abstract

An automatic rapid elongation system for polymer films is provided in the optical birefringence measurement system using phase modulation technology. It can measure optically and dynamically modular deformation in polymer films during rapid elongation process and stress relaxation after the completion of elongation. Micro and macroscopic information on the deformation in molecules of polymer films can be obtained by measuring birefringence retardation, stress and elastic modulus as the function of time, temperature and percentage of elongation. Advantages, details of the system and some data obtained are described.

Paper Details

Date Published: 16 August 1996
PDF: 4 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246180
Show Author Affiliations
Kentaro Egoshi, ORC Manufacturing Co., Ltd. (Japan)
Yoshihiro Mochida, ORC Manufacturing Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)

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