Share Email Print
cover

Proceedings Paper

Measurement of the magneto-optical Kerr effect using a polarimetric method
Author(s): Sang-Youl Kim; Hyeon Gon Lee; Y. H. Won
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A simple technique of measuring the polar magneto-optical Kerr effect using a rotating analyzer is developed. The technique of the rotating analyzer ellipsometer is adopted for the measurement of polarization state of light. The light intensities are digitized automatically by the simple system consisted of an analog-to-digital converter and a micro-encoder and then Fourier transformed. The expressions of rotation angle (theta) and ellipticity angle (epsilon) are obtained in terms of the Fourier coefficients of the light intensity versus rotating analyzer. This technique is applied to (theta) and (epsilon) measurement of Co/Pt films. The precision of 0.01 degree(s) in angle measurement is verified.

Paper Details

Date Published: 16 August 1996
PDF: 5 pages
Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246177
Show Author Affiliations
Sang-Youl Kim, Ajou Univ. (South Korea)
Hyeon Gon Lee, Ajou Univ. (South Korea)
Y. H. Won, Ajou Univ. (South Korea)


Published in SPIE Proceedings Vol. 2873:
International Symposium on Polarization Analysis and Applications to Device Technology
Toru Yoshizawa; Hideshi Yokota, Editor(s)

© SPIE. Terms of Use
Back to Top