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Proceedings Paper

Dynamic behavior of internal elements of high-frequency integrated circuits studied by time-resolved optical-beam-induced current (OBIC) method
Author(s): Harald Bergner; Klaus Hempel; Uwe Stamm
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Paper Details

Date Published: 1 February 1991
PDF: 10 pages
Proc. SPIE 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications, (1 February 1991); doi: 10.1117/12.24560
Show Author Affiliations
Harald Bergner, Friedrich-Schiller-Univ. Jena (Germany)
Klaus Hempel, Friedrich-Schiller-Univ. Jena (Germany)
Uwe Stamm, Friedrich-Schiller-Univ. Jena (Germany)


Published in SPIE Proceedings Vol. 1362:
Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications

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