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Proceedings Paper

Use of admittance spectroscopy to probe the DX-centers in AlGaAs
Author(s): S. Subramanian; S. Chakravarty; S. Anand; B. M. Arora
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Paper Details

Date Published: 1 February 1991
PDF: 12 pages
Proc. SPIE 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications, (1 February 1991); doi: 10.1117/12.24543
Show Author Affiliations
S. Subramanian, Tata Institute of Fundamental Research (India)
S. Chakravarty, Tata Institute of Fundamental Research (India)
S. Anand, Tata Institute of Fundamental Research (India)
B. M. Arora, Tata Institute of Fundamental Research (India)


Published in SPIE Proceedings Vol. 1362:
Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications

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