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Proceedings Paper

New simple ESPI configurations for deformation studies on large structures based on diffused reference beam
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Paper Abstract

Two simple Electronic Speckle Pattern Interferometer (ESPI) configurations have been devised based on diffused reference beam which provides out-of-plane displacement data over the whole field. Both configurations use a tiny diffuser to generate the reference beam. This makes the system insensitive to reference beam misalignment, simplifies the construction of ESPI setup and allows larger area of observation unlike the conventional ESPI system. Thermal deflection studies on a cantilever plate have been carried out. Experimental results and features over the conventional ESPI system are discussed.

Paper Details

Date Published: 19 July 1996
PDF: 7 pages
Proc. SPIE 2861, Laser Interferometry VIII: Applications, (19 July 1996); doi: 10.1117/12.245174
Show Author Affiliations
T. Santhanakrishnan, Anna Univ. (India)
Nandigana K. Krishna Mohan, Indian Institute of Technology/Madras (India)
Rajpal S. Sirohi, Indian Institute of Technology/Madras (India)


Published in SPIE Proceedings Vol. 2861:
Laser Interferometry VIII: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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