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Proceedings Paper

Polycapillary optics: status, limitations, and prospects
Author(s): Robert Gregory Downing; Walter M. Gibson; Carolyn A. MacDonald
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Paper Abstract

Recent developments in the design, fabrication and applications of polycapillary optics for x-rays and neutrons have produced impressive new results and possibilities. These include x-ray and neutron probe measurements; diffraction based structural analysis of thin metal and magnetic films, powders, and protein crystals; x-ray lithographic patterning of integrated electronics and microstructures; and materials and medical imaging applications. Advances in the understanding, control, and reproducibility of fabrication parameters along with recent commercial availability of these optics have increased their accessibility and broadened their application base. This will likely lead to the incorporation of polycapillary optic components in a variety of commercial x-ray and neutron analysis systems. Expansion of the effective x-ray energy range downward to 0.3 and upward to 80 keV opens new possibilities, especially for medical and astronomical applications. Quantitative agreement between computer simulations and observed properties of both individual capillaries and complete lens structures provides not only a reliable basis for design of custom optics for a particular source or application, but also provides a firm basis for defining the limitations of polycapillary optics. The broad range of demonstrated applications, as well as limitations and prospects for polycapillary optics will be discussed.

Paper Details

Date Published: 19 July 1996
PDF: 12 pages
Proc. SPIE 2859, Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications, (19 July 1996); doi: 10.1117/12.245135
Show Author Affiliations
Robert Gregory Downing, X-Ray Optical Systems, Inc. (United States)
Walter M. Gibson, SUNY/Albany (United States)
Carolyn A. MacDonald, SUNY/Albany (United States)

Published in SPIE Proceedings Vol. 2859:
Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications
Richard B. Hoover; F. Patrick Doty, Editor(s)

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