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Proceedings Paper

Application of monolithic polycapillary focusing optics in MXRF
Author(s): Ning Gao; Igor Yu. Ponomarev; Qi-Fan Xiao; Walter M. Gibson; D. A. Carpenter
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Paper Abstract

A monolithic polycapillary focusing optic, consisting of hundreds of thousands of small tapered glass capillaries, can collect a large solid angle of x-rays from a point source and guide then through the capillaries by multiple total reflections to form an intense focused beam. Such a focused beam has many applications in microbeam x-ray fluorescence (MXRF) analysis. Two monolithic polycapillary focusing optics were tested and characterized in a MXRF set- up using a microfocusing x-ray source. For the CuK(alpha ) line, the measured focal spot sizes of these optics were 105 micrometers and 43 micrometers full-width-half-maximum, respectively. When the source was operated at 16W, the average CuK(alpha ) intensities over the focal spots were measured to be 2.5 X 104 photons/s/micrometers2 and 8.9 X 104 photons/s/micrometers2, respectively. When we compared the monolithic optics to straight monocapillary optics with approximately the same output beam sizes, intensity gains of 16 and 44 were obtained. The optics were applied to the MXRF set-up to analyze trace elements in various samples and a minimum detection limit of about 2 pg was achieved for the transition elements (V, Cr, Mn, and Fe). The optics were also used to map the distributions of trace elements in various samples.

Paper Details

Date Published: 19 July 1996
PDF: 8 pages
Proc. SPIE 2859, Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications, (19 July 1996); doi: 10.1117/12.245134
Show Author Affiliations
Ning Gao, SUNY/Albany and X-Ray Optical Systems, Inc. (United States)
Igor Yu. Ponomarev, SUNY/Albany and X-Ray Optical Systems, Inc. (United States)
Qi-Fan Xiao, X-Ray Optical Systems, Inc. (United States)
Walter M. Gibson, SUNY/Albany (United States)
D. A. Carpenter, Oak Ridge Ctrs. for Manufacturing Technology (United States)


Published in SPIE Proceedings Vol. 2859:
Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications
Richard B. Hoover; F. Patrick Doty, Editor(s)

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