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Proceedings Paper

CdZnTe strip detectors for high-energy x-ray astronomy
Author(s): James L. Matteson; Wayne Coburn; Fred Duttweiller; Thomas M. Gasaway; William A. Heindl; Philippe C. Leblanc; Daniel R. MacDonald; Michael R. Pelling; Laurence E. Peterson; Richard E. Rothschild; Robert T. Skelton; Paul L. Hink; Chris Crabtree
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Paper Abstract

The scientific objectives and future requirements of high energy x-ray astronomy are discussed and concepts for imaging instruments based on CdZnTe detectors and coded masks are reviewed. An instrument concept based on CdZnTe strip detectors, HEXIS, is described in detail. Technical requirements for large area CdZnTe strip detectors are discussed and recent work at UCSD and WU on the capabilities of CdZnTe strip detectors is described in detail. Studies with small, approximately 50 micron beams demonstrate that crossed strip detectors have good properties for both spatial and spectral measurements.

Paper Details

Date Published: 19 July 1996
PDF: 16 pages
Proc. SPIE 2859, Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications, (19 July 1996); doi: 10.1117/12.245124
Show Author Affiliations
James L. Matteson, Univ. of California/San Diego (United States)
Wayne Coburn, Univ. of California/San Diego (United States)
Fred Duttweiller, Univ. of California/San Diego (United States)
Thomas M. Gasaway, Univ. of California/San Diego (United States)
William A. Heindl, Univ. of California/San Diego (United States)
Philippe C. Leblanc, Univ. of California/San Diego (United States)
Daniel R. MacDonald, Univ. of California/San Diego (United States)
Michael R. Pelling, Univ. of California/San Diego (United States)
Laurence E. Peterson, Univ. of California/San Diego (United States)
Richard E. Rothschild, Univ. of California/San Diego (United States)
Robert T. Skelton, Univ. of California/San Diego (United States)
Paul L. Hink, Washington Univ. (United States)
Chris Crabtree, Washington Univ. (United States)


Published in SPIE Proceedings Vol. 2859:
Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications
Richard B. Hoover; F. Patrick Doty, Editor(s)

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