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Proceedings Paper

Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes
Author(s): Ahsen M. Hussain; Karsten Dan Joensen; P. Hoeghoej; Finn Erland Christensen; Eric Louis; Harm-Jan Voorma; Yang Soong; Nicholas E. White; Ian S. Anderson
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Paper Abstract

W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. The roughness value obtained from the Si wafers and the DURAN glass are in the range 3.0-4.2 angstrom and 4.4-4.6 angstrom, respectively. For the epoxy-replicated Au mirrors roughnesses of 5.0-5.8 angstrom are achieved, while the roughness of the SRG flight mirrors are in the range of 8.5-11.0 angstrom. This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes.

Paper Details

Date Published: 19 July 1996
PDF: 7 pages
Proc. SPIE 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III, (19 July 1996); doi: 10.1117/12.245113
Show Author Affiliations
Ahsen M. Hussain, Danish Space Research Institute and Harvard-Smithsonian Ctr. for Astrophysics (Denmark)
Karsten Dan Joensen, Univ. of Copenhagen (Denmark)
P. Hoeghoej, Institut Laue-Langevin (France)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Eric Louis, FOM-Institute for Plasma Physics Rijnhuizen (Netherlands)
Harm-Jan Voorma, FOM-Institute for Plasma Physics Rijnhuizen (Netherlands)
Yang Soong, NASA Goddard Space Flight Ctr. (United States)
Nicholas E. White, NASA Goddard Space Flight Ctr. (United States)
Ian S. Anderson, Institut Laue-Langevin (France)

Published in SPIE Proceedings Vol. 2805:
Multilayer and Grazing Incidence X-Ray/EUV Optics III
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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