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Proceedings Paper

Monitoring program for the coating of the AXAF flight optics
Author(s): Suzanne E. Romaine; Ricardo J. Bruni; Anna M. Clark; William A. Podgorski; D. Schultz; Daniel A. Schwartz; Leon P. Van Speybroeck; Ying Zhou; Robert Edward Hahn; George T. Johnston; Andrew J. Longmire; J. T. Humphreys; Alan P. Shapiro; R. Tjulander; E. Barinek
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Paper Abstract

The Mission Support Team SAO Reflectivities studies laboratory was responsible for the verification of the coating performance specification during the coating of the eight AXAF flight optics. Prior to the start of the coating of the flight optics, it was necessary to verify the scaleup of the coating chamber parameters from the test chamber to the flight optic coating chamber as well as to verify repeatability of coating quality. Immediately prior to the coating of each flight optic, witness samples were coated to verify the coating specification for each particular geometry. Similar witness samples were coated to verify the coating specification for each particular geometry. Similar witness samples were also coated with each flight optic. An overview of this monitoring program is presented along with a description of how the measurements are made, what tests are used to verify performance and a description of the witness sample deployment. Preliminary data on coating uniformity will also be presented.

Paper Details

Date Published: 19 July 1996
PDF: 10 pages
Proc. SPIE 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III, (19 July 1996); doi: 10.1117/12.245089
Show Author Affiliations
Suzanne E. Romaine, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Ricardo J. Bruni, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Anna M. Clark, Harvard-Smithsonian Ctr. for Astrophysics (United States)
William A. Podgorski, Harvard-Smithsonian Ctr. for Astrophysics (United States)
D. Schultz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Daniel A. Schwartz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Leon P. Van Speybroeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Ying Zhou, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Robert Edward Hahn, Optical Coating Lab., Inc. (United States)
George T. Johnston, Optical Coating Lab., Inc. (United States)
Andrew J. Longmire, Optical Coating Lab., Inc. (United States)
J. T. Humphreys, NASA Marshall Space Flight Ctr. (United States)
Alan P. Shapiro, NASA Marshall Space Flight Ctr. (United States)
R. Tjulander, NASA Marshall Space Flight Ctr. (United States)
E. Barinek, TRW Inc. (United States)


Published in SPIE Proceedings Vol. 2805:
Multilayer and Grazing Incidence X-Ray/EUV Optics III
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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