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Proceedings Paper

Characterization of the photorefractive effect in Ti:LiNbO3 stripe waveguides
Author(s): Raimund Volk; Wolfgang Sohler
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Paper Abstract

To allow an extremely sensitive measurement of optically induced changes of the index of refraction in a Ti:LiNbO3 stripe waveguide a specific two wavelengths " excite and probe" technique has been recently developed [1J taking advantage of the large phase sensitivity of a waveguide resonator. A resolution of Ln 5 x iO has been achieved which is nearly two orders of magnitude better than demonstrated with conventional methods. For both polarizations and for several wavelengths in the visible and near infrared the most important parameters characterizing the photorefractive effect could be determined. They were evaluated by analyzing the measured index changes using a widely accepted theoretical model adopted to the waveguide geometry.

Paper Details

Date Published: 1 February 1991
PDF: 7 pages
Proc. SPIE 1362, Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications, (1 February 1991); doi: 10.1117/12.24471
Show Author Affiliations
Raimund Volk, Univ.-GH-Paderborn (Germany)
Wolfgang Sohler, Univ.-GH-Paderborn (Germany)


Published in SPIE Proceedings Vol. 1362:
Physical Concepts of Materials for Novel Optoelectronic Device Applications II: Device Physics and Applications

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