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Proceedings Paper

Optical characterization of InP epitaxial layers on different substrates
Author(s): Kaili L. Jiao; Jim P. Zheng; HoiSing Kwok; Wayne A. Anderson
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Paper Details

Date Published: 1 March 1991
PDF: 8 pages
Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); doi: 10.1117/12.24441
Show Author Affiliations
Kaili L. Jiao, SUNY/Buffalo (United States)
Jim P. Zheng, SUNY/Buffalo (United States)
HoiSing Kwok, SUNY/Buffalo (Hong Kong)
Wayne A. Anderson, SUNY/Buffalo (United States)


Published in SPIE Proceedings Vol. 1361:
Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization

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