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Proceedings Paper

Determination of electrostatic potentials and charge distributions in bulk and at interfaces by electron microscopy techniques
Author(s): B. Hugsted; K. Gjonnes; J. Tafto; Jon Gjonnes; H. Matsuhata
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Paper Details

Date Published: 1 March 1991
PDF: 7 pages
Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); doi: 10.1117/12.24438
Show Author Affiliations
B. Hugsted, Univ. of Oslo (Norway)
K. Gjonnes, Univ. of Oslo (Norway)
J. Tafto, Univ. of Oslo (Norway)
Jon Gjonnes, Univ. of Oslo (Norway)
H. Matsuhata, Electrotechnical Lab. (Japan)


Published in SPIE Proceedings Vol. 1361:
Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization

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