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Proceedings Paper

Advancement of x-ray microscopy technology and its application to metal solidification studies
Author(s): William F. Kaukler; Peter A. Curreri
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Paper Abstract

The technique of x-ray projection microscopy is being used to view, in real time, the structures and dynamics of the solid-liquid interface during solidification. By employing a hard x-ray source with sub-micron dimensions, resolutions of 2 micrometers can be obtained with magnifications of over 800 X. Specimen growth conditions need to be optimized and the best imaging technologies applied to maintain x-ray image resolution, contrast and sensitivity. It turns out that no single imaging technology offers the best solution and traditional methods like radiographic film cannot be used due to specimen motion (solidification). In addition, a special furnace design is required to permit controlled growth conditions and still offer maximum resolution and image contrast.

Paper Details

Date Published: 12 July 1996
PDF: 11 pages
Proc. SPIE 2809, Space Processing of Materials, (12 July 1996); doi: 10.1117/12.244353
Show Author Affiliations
William F. Kaukler, Univ. of Alabama in Huntsville (United States)
Peter A. Curreri, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 2809:
Space Processing of Materials
Narayanan Ramachandran, Editor(s)

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