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Proceedings Paper

Localization of hot spots in silicon devices with a laser scanning microscope
Author(s): Harald Bergner; A. Krause; Uwe Stamm
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Paper Details

Date Published: 1 March 1991
PDF: 9 pages
Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); doi: 10.1117/12.24435
Show Author Affiliations
Harald Bergner, Friedrich-Schiller-Univ. Jena (Germany)
A. Krause, Friedrich-Schiller-Univ. Jena (Germany)
Uwe Stamm, Friedrich-Schiller-Univ. Jena (Germany)


Published in SPIE Proceedings Vol. 1361:
Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization

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