Share Email Print
cover

Proceedings Paper

Luminescence molulation for the characterization of radiation damage within scintillator material
Author(s): Eberhard G. Bayer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The methode of luminescence modulation consists of a superposition of cw X-ray excitation and a short pulsed UV-light excitation. Making use of an excimer laser as UV source and a spectroscopic array detector with wavelength and time resolution it is possible to make sensitive short and long term characterisation of X-ray produced radiation damages within scintillator materials. Preliminary results of different doped and undoped materials will be presented and compared with results of conventional luminescence measurements.

Paper Details

Date Published: 1 March 1991
PDF: 5 pages
Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); doi: 10.1117/12.24396
Show Author Affiliations
Eberhard G. Bayer, Seimens AG (Germany)


Published in SPIE Proceedings Vol. 1361:
Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization
Manijeh Razeghi, Editor(s)

© SPIE. Terms of Use
Back to Top