Share Email Print
cover

Proceedings Paper

System for the automatic inspection of image intensifier tubes
Author(s): Mark A. Sartor; John W. Pecina; Carl Paul; Bill Helms; Dennis L. Alsman
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Objectivity, measurement accuracy and repeatability are compromised whenever the human vision system is involved in assessing the performance of optical and electro-optical components. One example of this is found in the inspection of image intensifier tubes (IITs). This paper discusses the use of an automated intensifier measurement system (AIMS), that was developed to overcome the drawbacks of the subjective evaluation methods currently in use. The AIMS offers significant improvement over visual inspection techniques typically performed by a human operator. The AIMS quantifies an IIT's performance in a number of categories including: resolution, geometric image distortion, output brightness uniformity (opaque and bright spots), and image format; measurement accuracy is traceable to NIST. Innovative image-processing techniques allow precise characterization of the entire IIT using an off-the-shelf CCD that can capture the complete intensified image without employing scanning or magnifying techniques. The system also performs a self test to ensure correct setup. Now for the first time, because all the necessary setup adjustments and measurements are performed under software control, all subjectivity is eliminated, allowing totally objective measurements to be made. System performance results are discussed.

Paper Details

Date Published: 26 June 1996
PDF: 12 pages
Proc. SPIE 2753, Visual Information Processing V, (26 June 1996); doi: 10.1117/12.243584
Show Author Affiliations
Mark A. Sartor, Xybion Corp. (United States)
John W. Pecina, Xybion Corp. (United States)
Carl Paul, Xybion Corp. (United States)
Bill Helms, Naval Surface Warfare Ctr. (United States)
Dennis L. Alsman, Naval Surface Warfare Ctr. (United States)


Published in SPIE Proceedings Vol. 2753:
Visual Information Processing V
Richard D. Juday; Stephen K. Park, Editor(s)

© SPIE. Terms of Use
Back to Top