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Proceedings Paper

Modeling and simulation of IR scenes and sensors in the UK: current and future capabilities
Author(s): A. Marshall; Kevin St. John Murphy
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Paper Abstract

The Defence Research Agency at Malvern (Electronics Sector) has developed a computer model called SMARTI (simulation and modeling of array thermal imagers) which allows simulation of the effects of the various components of a focal plane array infra-red imager on a thermal scene. It can include a range of dynamic effects such as sinusoidal vibration, random jitter and linear motion, and can simulate both staring arrays and long linear arrays with TDI (time delay and integrate). The present version of SMARTI incorporates a thermal scene generator called IFS (image formation system) which can create scenes for the 3 - 5 and 8 - 14 micron wavebands. It also includes the ORACLE visual acquisition model. The Electronics Sector at Malvern is now planning to develop a real-time scene and sensor simulation facility called SORCERESS (software for realistic computer-generation of environments in real-time for evaluation of sensors and scenarios). This model will include the same functionality as the present SMARTI model, but will run on a silicon graphics reality engine at real or near-real-time speeds and thus permit a more extensive range of studies to be performed. It also will be able to create scenery for any range of wavelengths between 0.42 and 14 microns, thereby extending the scene and sensor modeling capability into the visible and near IR wavebands. This will enable the benefits of multi-sensor systems to be established.

Paper Details

Date Published: 27 June 1996
PDF: 8 pages
Proc. SPIE 2744, Infrared Technology and Applications XXII, (27 June 1996); doi: 10.1117/12.243501
Show Author Affiliations
A. Marshall, Defence Research Agency Malvern (United Kingdom)
Kevin St. John Murphy, Defence Research Agency Malvern (United Kingdom)


Published in SPIE Proceedings Vol. 2744:
Infrared Technology and Applications XXII
Bjorn F. Andresen; Marija S. Scholl, Editor(s)

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