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Proceedings Paper

Evaluation of the 1040x1040 PtSi CSD for astronomical use
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Paper Abstract

We present the performance of the 1040 by 1040 PtSi CSD manufactured by Mitsubishi Electric Co. for an application of astronomical imaging. The sensor was evaluated both in laboratory and in real observing conditions. The results of noise, quantum efficiency, linearity, dark current and photometric accuracy are presented.

Paper Details

Date Published: 27 June 1996
PDF: 12 pages
Proc. SPIE 2744, Infrared Technology and Applications XXII, (27 June 1996); doi: 10.1117/12.243453
Show Author Affiliations
Kenshi Yanagisawa, Univ. of Tokyo (Japan)
Nobunari Itoh, Univ. of Tokyo (Japan)
Takashi Ichikawa, Univ. of Tokyo (Japan)


Published in SPIE Proceedings Vol. 2744:
Infrared Technology and Applications XXII
Bjorn F. Andresen; Marija S. Scholl, Editor(s)

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