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Proceedings Paper

Measurement of the sizes of the semiconductor crystallites in colored glasses through neutron scattering
Author(s): Gian Piero Banfi; Vittorio Degiorgio; A. R. Rennie; Giancarlo C. Righini
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Paper Abstract

Semiconductor doped glasses have been studied by small angle neutron scattering. The results allow a precise determination of the average size of the microcrystallites and to evidence the volume depleted of semiconductor costituents that sorrounds each particle

Paper Details

Date Published: 1 March 1991
PDF: 7 pages
Proc. SPIE 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization, (1 March 1991); doi: 10.1117/12.24307
Show Author Affiliations
Gian Piero Banfi, Univ. di Pavia (Italy)
Vittorio Degiorgio, Univ. di Pavia (Italy)
A. R. Rennie, Institut Laue Langevin (United Kingdom)
Giancarlo C. Righini, IROE (Italy)


Published in SPIE Proceedings Vol. 1361:
Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization
Manijeh Razeghi, Editor(s)

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